Parameter | Value | Units | Notes |
---|---|---|---|
General | |||
Pressure Range | 1.25 ~ 7.5 | kPa | |
Proof Pressure | 35 | kPa | |
Burst Pressure | 700 | kPa | |
Electrical @72°F (25°C) unless noted | |||
Excitation (DC) | 5 | Volt | 10VDC |
Bridge Resistance | 5000 ±20% | Ω | Maximum |
Environment | |||
Operating Temp. | -40 to 125 | °C | |
Storage Temp. | -55 to 150 | °C | |
Mechanical | |||
Dimensions | 2.4 x 2.0 x 0.9 | mm | L x W x H |
Media Compatibility | Clean dry air, non-corrosive gases | ||
Performance Parameters (1) | |||
Zero Offset | ± 10 | mV/V | 2 |
Sensitivity | 3 ± 1 | mV/V/kPa | |
Pressure Non Linearity (BFSL) | ± 0.15 | %FSO | 3 |
Pressure Hysteresis | 0.1 | %FSO | 4 |
Temperature Coefficient of Zero | ± 3 | μV/V/°C | 4, 5 |
Temperature Coefficient of Resistance | 0.08 | %/°C | 4, 5 |
Temperature Coefficient of Sensitivity | -0.19 | %/°C | 4, 5 |
Zero Thermal Hysteresis | <10 | μV/V | 4, 5 |
Notes
- All values measured at 25 ºC and 5 VDC excitation, unless otherwise noted. Samples from each wafer are used to verify bridge resistance, offset, span, Linearity and die performance in the temperature range between 0 ºC to 70 ºC.
- Parameter is 100% measured at wafer probing at normal conditions.
- Best fit straight line. Measured in 0 to 2.5 kPa range.
- Typical value.
- Between 0 ºC to 70 ºC.